In PAUT, a linear scan and the ability to move a beam along an axis can also be referred to as?

In PAUT, a linear scan and the ability to move a beam along an axis can also be referred to as?

• A. S-scan
• B. E-scan
• C. A-scan
• D. B-scan

Answer: (B)

The ability to move a beam along an axis in Phased Array Ultrasonic Testing (PAUT) is accurately described as an E-scan. This technique allows for a side-to-side movement of the beam while maintaining a fixed angle of incidence, enabling the capture of detailed information about the material under inspection. The E-scan provides a two-dimensional image that is valuable for analyzing flaws or features within the scanned object. By using this method, operators can effectively identify and characterize defects in a more comprehensive manner compared to simpler scanning methods. This aspect of versatility and detail in presentation sets the E-scan apart from other scanning techniques potentially offered in PAUT, such as the A-scan, which typically presents data in a one-dimensional format, or the B-scan, which provides a cross-sectional view but without the same lateral movement capability. The S-scan, while a valid scanning method, does not typically emphasize the linear movement of the beam along an axis in the same context as the E-scan does.

The ability to move a beam along an axis in Phased Array Ultrasonic Testing (PAUT) is accurately described as an E-scan. This technique allows for a side-to-side movement of the beam while maintaining a fixed angle of incidence, enabling the capture of detailed information about the material under inspection. The E-scan provides a two-dimensional image that is valuable for analyzing flaws or features within the scanned object.

By using this method, operators can effectively identify and characterize defects in a more comprehensive manner compared to simpler scanning methods. This aspect of versatility and detail in presentation sets the E-scan apart from other scanning techniques potentially offered in PAUT, such as the A-scan, which typically presents data in a one-dimensional format, or the B-scan, which provides a cross-sectional view but without the same lateral movement capability. The S-scan, while a valid scanning method, does not typically emphasize the linear movement of the beam along an axis in the same context as the E-scan does.